WO2024028714 - PULSED LASER DIODE DRIVER CURRENT MEASUREMENT CIRCUIT
National phase entry is expected:
Publication Number
WO/2024/028714
Publication Date
08.02.2024
International Application No.
PCT/IB2023/057648
International Filing Date
27.07.2023
Title **
[English]
PULSED LASER DIODE DRIVER CURRENT MEASUREMENT CIRCUIT
[French]
CIRCUIT DE MESURE DE COURANT D'ATTAQUE DE DIODE LASER PULSÉE
Applicants **
SILANNA ASIA PTE LTD
10 Collyer Quay
#10-01 Ocean Financial Centre
Singapore 049315, SG
Inventors
COLLES, Joseph H.
4795 Eastgate Mall, Suite 100
San Diego, California 92121, US
ROSENBAUM, Steven E.
4795 Eastgate Mall, Suite 100
San Diego, California 92121, US
MOLIN, Stuart B.
4795 Eastgate Mall, Suite 100
San Diego, California 92121, US
Priority Data
63/370,271
03.08.2022
US
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
| * | |
| * | |
International Searching Authority |
MOIP
* |
| Applicant's Legal Status |
Legal Entity
* |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
* |
| Translation |
|
Recalculate
* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing | 1214 | |
| EPO | Filing, Examination | 7348 | |
| Japan | Filing | 529 | |
| South Korea | Filing | 575 | |
| USA | Filing, Examination | 2635 |
Total: 12301 USD
The term for entry into the National Phase has expired. This quotation is for informational purposes only
Abstract[English]
A pulsed laser diode driver includes a laser diode switch and a bypass switch to control a current flow through an inductor to produce a high-current pulse through a laser diode, the high-current pulse corresponding to a peak current of a resonant waveform developed at an anode of the laser diode. A current pulse measurement circuit receives a sense voltage developed at a sense resistance and generates, based on the sense voltage, a current sense signal that corresponds to the peak current amplitude of the high-current pulse through the laser diode.[French]
Un circuit d'attaque de diode laser pulsée comprend un commutateur à diode laser et un commutateur de dérivation pour commander un flux de courant à travers une bobine d'induction pour produire une impulsion de courant élevé à travers une diode laser, l'impulsion de courant élevé correspondant à un courant de crête d'une forme d'onde résonante développée au niveau d'une anode de la diode laser. Un circuit de mesure d'impulsion de courant reçoit une tension de détection développée à une résistance de détection et génère, sur la base de la tension de détection, un signal de détection de courant qui correspond à l'amplitude de courant de crête de l'impulsion de courant élevé à travers la diode laser.